S-parameter measurements

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Overview of Service Contract of S-parameter Measurements

MoDeCH offers a wide variety of solution services including service contract of accurate S-parameter measurements and technical consulting to transfer measurement know-how.

Concerned about whether or not measured data of S-parameters is accurate?

Some customers say that they have concerns about the accuracy of measured data of S-parameters. Since verifications of the accuracy of S-parameter measurements require an extremely high level of technical expertise, customers may find a situation where only few companies can deal with such concerns and provide them with appropriate solutions.
Based on our advanced measurement techniques that we have accumulated in the field of device modeling since MoDeCH’s establishment in 2002 and considerable achievements, we offer measurement solutions for particular needs of each customer including service contract of S-parameter measurements as well as the accuracy verifications of S-parameters. Accuracy of S-parameter measurements (the true value of S-parameters of the device to be measured) depends on the measurement methods as shown below.
No matter how excellent a measurement instrument is, the values of S-parameters fluctuate depending on the methods to remove the effects between a reference plane determined by the calibration methods or calibration and the device to be measured. The amount of fluctuation increases with higher frequencies.

MoDeCH’s resources of measurement techniques

  • Experienced engineers familiar with measurement principles
  • Experienced engineers familiar with principles of SOLT and TRL calibration
  • The optimal de-embedding methods including ISD (In Situ De-embedding)
  • High-frequency jigs and design techniques of circuit layout patterns
  • High-frequency probing techniques
  • Device modeling techniques in high frequencies up to 110 GHz
  • Industry standard Premier PNA-X supporting true differential measurements up to 110 GHz made by Keysight Technologies
  • Multi-directional prober supporting high frequencies which can contact points of a DUT from all angles to measure

Methods of Accurate S-parameter Measurements with a High Level of Technical Expertise

When the device to be measured is mounted on a circuit board with connectors, possible error factors in removing the effects between reference planes determined with a coaxial calibration kit and reference planes of the device to be measured are as follows:
(1) Matching of high-frequency electrical characteristics of connectors
(2) Matching of high-frequency electrical characteristics of a part where connectors are attached
(3) Matching of substrate characteristics between a part where connectors are attached and the device to be measured (symmetry as needed)
Sophisticated jigs are created to minimize such error factors. However, minimizing error factors by general users requires significant knowledge and experience, as well as both time and money. Usually, even it’s not clear whether these error factors are minimized.

Methods of Accurate S-parameter Measurements with High-frequency Probing and De-embedding Methods

We recommend “high-frequency probing techniques” and “the optimal de-embedding methods including ISD” as appropriate methods to remove electrical reproducibility and matching of both connectors and a part where connectors are attached, and error factors between a part where connectors are attached and reference planes of the device to be measured.

High-frequency Probing Techniques

To apply high-frequency probing techniques, all measurement equipment that we need for measurements with such techniques should be prepared. Considering utilization and investment effect of the measurement equipment, outsourcing measurement services only when needed may cost less than measuring everything in-house. In such a case, please use our service contract of measurements. When the device to be measured has a vertical structure, we use our multi-directional prober to measure accurate high-frequencies without unnecessary wire routing.

Optimal De-embedding Methods Including ISD

Conventional de-embedding methods using OPEN/SHORT/THRU allow us to remove a tiny amount of electrical characteristics of electrode sections on a pad of the package in a high-frequency probe system. We will also use the following ISD method as necessary.
ISD (InSitu De-embedding) を含む最適なde-embedding手法
ISD (InSitu De-embedding) を含む最適なde-embedding手法

Provided by AtaiTec Corp. in the U.S.

If you have any trouble measuring S-parameters accurately, please feel free to contact MoDeCH. We will gladly respond to your special request of services other than the above. In addition to the service contract, we offer a wide variety of solutions including technical consulting to transfer measurement know-how.

  • TEL:042-656-3360 〔受付時間〕平日9:00~18:00