Meas. Environment

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MoDeCH's measurement environment

MoDeCH Site (a wafer of up to 8 inches)

  • Wafer Probe Station (with temperature chamber)
  • High Frequency Network Analyzer (110GHz)
    *Keysight Technologies : N5247A
  • DC Semiconductor Parametric Analyzer
  • Precision LCR Meter
  • pA meter/DC Voltage Source
  • Digitizing Oscilloscope
  • Function Generator
  • Ultrasensitive 1/f noise Measurement System
  自社保有測定機器

Contracted Site (a wafer of up to 300mm)

  • Vector Semiconductor Co.,Ltd.
  • Tiatech, INC.
*We do measurement services by our specialized staff.
We strictly manage customer's technique informations.